Verification of Charge Transfer in Metal-Insulator-Oxide
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Vertical Transport Control of Electrical Charge Carriers in
Verification of Charge Transfer in Metal-Insulator-Oxide Semiconductor Diodes via Defect Engineering of Insulator
Rectification Mechanism of a P-type Oxide-based Metal–Insulator
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On Practical Charge Injection at the Metal/Organic Semiconductor
Deterministic conversion between memory and threshold resistive switching via tuning the strong electron correlation
Figure 3 from Charge Trapping Memory Characteristics of Amorphous
Heterointerface engineered electronic and magnetic phases of NdNiO3 thin films
Temperature dependence of the vertical current in the MIOS
Charge transfer in metal–organic frameworks - Chemical Communications (RSC Publishing) DOI:10.1039/D2CC05522H
Ion-gating analysis on conduction mechanisms in oxide
